Structure determination of thin CoFe films by anomalous x-ray diffraction

Andrei Gloskovskii, Gregory Stryganyuk, Siham Ouardi, Gerhard H. Fecher, Claudia Felser, Jaroslav Hamrle, Jaromír Pištora, Subrojati Bosu, Kesami Saito, Yuya Sakuraba, Koki Takanashi
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4755801