Degradation analysis and characterization of multifilamentary conduction patterns in high-field stressed atomic-layer-deposited TiO2/Al2O3 nanolaminates on GaAs

E. Miranda, J. Suñé, T. Das, C. Mahata, C. K. Maiti
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4754510
The author haven't yet claimed this publicationThe author haven't yet claimed this publication