Features of temperature dependence of contact resistivity in ohmic contacts on lapped n-Si

A. V. Sachenko, A. E. Belyaev, N. S. Boltovets, A. O. Vinogradov, V. P. Kladko, R. V. Konakova, Ya. Ya. Kudryk, A. V. Kuchuk, V. N. Sheremet, S. A. Vitusevich
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4752715
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