Switching of nanosized filaments in NiO by conductive atomic force microscopy

F. Nardi, D. Deleruyelle, S. Spiga, C. Muller, B. Bouteille, D. Ielmini
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4752032
The author haven't finished explaining this publicationThe author haven't finished explaining this publication
The following have contributed to this page: Daniele Ielmini