Effects of stress on the dielectric function of strained pseudomorphic Si1−xGex alloys from 0 to 75% Ge grown on Si (001)

Gangadhara Raja Muthinti, Manasa Medikonda, Thomas Adam, Alexander Reznicek, Alain C. Diebold
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4751275