Structural and micromechanical analyses by polarized Raman spectroscopy of wurtzitic GaN films grown on (0001) sapphire substrates

Wenliang Zhu, Sungkyun Park, Yuji Okumura, Andrea Leto, Giuseppe Pezzotti
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4751026
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