Transport properties of Ni, Co, Fe, Mn doped Cu0.01Bi2Te2.7Se0.3 for thermoelectric device applications

K. C. Lukas, W. S. Liu, Z. F. Ren, C. P. Opeil
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4749806