In situ transmission electron microscopy study of dielectric breakdown of surface oxides during electric field-assisted sintering of nickel nanoparticles

  • Cecile S. Bonifacio, Jorgen F. Rufner, Troy B. Holland, Klaus van Benthem
  • Applied Physics Letters, August 2012, American Institute of Physics
  • DOI: 10.1063/1.4749284

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http://dx.doi.org/10.1063/1.4749284

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