Anomalous behavior of negative bias illumination stress instability in an indium zinc oxide transistor: A cation combinatorial approach

Seungha Oh, Bong Seob Yang, Yoon Jang Kim, Myeong Sook Oh, Mi Jang, Hoichang Yang, Jae Kyeong Jeong, Cheol Seong Hwang, Hyeong Joon Kim
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4748884
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