Ultra-fast calorimetry study of Ge2Sb2Te5 crystallization between dielectric layers

  • J. Orava, A. L. Greer, B. Gholipour, D. W. Hewak, C. E. Smith
  • Applied Physics Letters, August 2012, American Institute of Physics
  • DOI: 10.1063/1.4748881

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http://dx.doi.org/10.1063/1.4748881

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