Effect of tip polarity on Kelvin probe force microscopy images of thin insulator CaF2 films on Si(111)

Ayhan Yurtsever, Yoshiaki Sugimoto, Masaki Fukumoto, Masayuki Abe, Seizo Morita
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4748291