Characterization of Ni(Si,Ge) films on epitaxial SiGe(100) formed by microwave annealing

Cheng Hu, Peng Xu, Chaochao Fu, Zhiwei Zhu, Xindong Gao, Asghar Jamshidi, Mohammad Noroozi, Henry Radamson, Dongping Wu, Shi-Li Zhang
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4748111