Characterization of Ni(Si,Ge) films on epitaxial SiGe(100) formed by microwave annealing

  • Cheng Hu, Peng Xu, Chaochao Fu, Zhiwei Zhu, Xindong Gao, Asghar Jamshidi, Mohammad Noroozi, Henry Radamson, Dongping Wu, Shi-Li Zhang
  • Applied Physics Letters, August 2012, American Institute of Physics
  • DOI: 10.1063/1.4748111

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http://dx.doi.org/10.1063/1.4748111

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