Enhanced thermal conductivity of polycrystalline aluminum nitride thin films by optimizing the interface structure

T. S. Pan, Y. Zhang, J. Huang, B. Zeng, D. H. Hong, S. L. Wang, H. Z. Zeng, M. Gao, W. Huang, Y. Lin
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4748048
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