Characterization of grain boundaries in multicrystalline silicon with high lateral resolution using conductive atomic force microscopy

Maximilian Rumler, Mathias Rommel, Jürgen Erlekampf, Maral Azizi, Tobias Geiger, Anton J. Bauer, Elke Meißner, Lothar Frey
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4746742
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The following have contributed to this page: Dr. Mathias Rommel