Volatile resistive switching in Cu/TaOx/δ-Cu/Pt devices

  • Tong Liu, Mohini Verma, Yuhong Kang, Marius Orlowski
  • Applied Physics Letters, August 2012, American Institute of Physics
  • DOI: 10.1063/1.4746276

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http://dx.doi.org/10.1063/1.4746276

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