Structural, dielectric, ferroelectric and piezoresponse force microscopy characterizations of bilayered Bi0.9Dy0.1FeO3/K0.5Na0.5NbO3 lead-free multiferroic films

Ling Chen, Wei Ren, Zuo-Guang Ye, Aifen Tian, Xiaoqing Wu, Peng Shi
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4746086
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