Direct determination of the effect of strain on domain morphology in ferroelectric superlattices with scanning probe microscopy

K. Kathan-Galipeau, P. P. Wu, Y. L. Li, L. Q. Chen, A. Soukiassian, Y. Zhu, D. A. Muller, X. X. Xi, D. G. Schlom, D. A. Bonnell
  • Journal of Applied Physics, September 2012, American Institute of Physics
  • DOI: 10.1063/1.4746081
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