Conduction band caused by oxygen vacancies in aluminum oxide for resistance random access memory

Seisuke Nigo, Masato Kubota, Yoshitomo Harada, Taisei Hirayama, Seiichi Kato, Hideaki Kitazawa, Giyuu Kido
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4745048
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