Band alignment of InGaZnO4/Si interface by hard x-ray photoelectron spectroscopy

Kyeongmi Lee, Kenji Nomura, Hiroshi Yanagi, Toshio Kamiya, Eiji Ikenaga, Takeharu Sugiyama, Keisuke Kobayashi, Hideo Hosono
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4744983
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