Correlation between in-plane strain and optical polarization of Si-doped AlGaN epitaxial layers as a function of Al content and Si concentration

Satoshi Kurai, Kazuhide Shimomura, Hideaki Murotani, Yoichi Yamada, Hideto Miyake, Kazumasa Hiramatsu
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4743016