Degradation of potential barriers in ZnO-based chip varistors due to electrostatic discharge

Sakyo Hirose, Hideaki Niimi, Keisuke Kageyama, Hideharu Ieki, Takahisa Omata, Shinya Otsuka-Yao-Matsuo
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4742987
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The following have contributed to this page: Associate Professor Takahisa Omata