Correlation between charge transport and electroluminescence properties of Si-rich oxide/nitride/oxide-based light emitting capacitors

Y. Berencén, J. M. Ramírez, O. Jambois, C. Domínguez, J. A. Rodríguez, B. Garrido
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4742054