Strain rate sensitivity and activation volume of Cu/Ni metallic multilayer thin films measured via micropillar compression

  • J. S. Carpenter, A. Misra, M. D. Uchic, P. M. Anderson
  • Applied Physics Letters, July 2012, American Institute of Physics
  • DOI: 10.1063/1.4739521

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http://dx.doi.org/10.1063/1.4739521

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