Focused ion beam induced structural modifications in thin magnetic films

O. D. Roshchupkina, J. Grenzer, T. Strache, J. McCord, M. Fritzsche, A. Muecklich, C. Baehtz, J. Fassbender
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4739302