Optimization of sample-chip design for stub-matched radio-frequency reflectometry measurements

S. Hellmüller, M. Pikulski, T. Müller, B. Küng, G. Puebla-Hellmann, A. Wallraff, M. Beck, K. Ensslin, T. Ihn
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4739248
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