In-situ transmission electron microscopy of partial-dislocation glide in 4H-SiC under electron radiation

  • Yutaka Ohno, Ichiro Yonenaga, Kotaro Miyao, Koji Maeda, Hidekazu Tsuchida
  • Applied Physics Letters, July 2012, American Institute of Physics
  • DOI: 10.1063/1.4737938

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http://dx.doi.org/10.1063/1.4737938

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