Influence of alloy inhomogeneities on the determination by Raman scattering of composition and strain in Si1–xGex/Si(001) layers

J. S. Reparaz, I. C. Marcus, A. R. Goñi, M. Garriga, M. I. Alonso
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4737486