Tungsten silicide films for microwave kinetic inductance detectors

  • Thomas Cecil, Antonino Miceli, Orlando Quaranta, Chian Liu, Daniel Rosenmann, Sean McHugh, Benjamin Mazin
  • Applied Physics Letters, July 2012, American Institute of Physics
  • DOI: 10.1063/1.4737408

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http://dx.doi.org/10.1063/1.4737408

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