Noise and transport characterization of single molecular break junctions with individual molecule

V. A. Sydoruk, D. Xiang, S. A. Vitusevich, M. V. Petrychuk, A. Vladyka, Y. Zhang, A. Offenhäusser, V. A. Kochelap, A. E. Belyaev, D. Mayer
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4736558
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