Study of the photoluminescence emission line at 3.33 eV in ZnO films

V. Sh. Yalishev, Y. S. Kim, X. L. Deng, B. H. Park, Sh. U. Yuldashev
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4733952
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