High resolution x-ray diffraction methodology for the structural analysis of one-dimensional nanostructures

M. C. Martínez-Tomás, D. N. Montenegro, V. Sallet, V. Muñoz-Sanjosé
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4730403
The author haven't yet claimed this publicationThe author haven't yet claimed this publication