Observation of peripheral charge induced low frequency capacitance-voltage behaviour in metal-oxide-semiconductor capacitors on Si and GaAs substrates

É. O’Connor, K. Cherkaoui, S. Monaghan, D. O’Connell, I. Povey, P. Casey, S. B. Newcomb, Y. Y. Gomeniuk, G. Provenzano, F. Crupi, G. Hughes, P. K. Hurley
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4729331
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