Strain-induced effects on the dielectric constant for thin, crystalline rare earth oxides on silicon

  • D. Schwendt, H. J. Osten, P. Shekhter, M. Eizenberg
  • Applied Physics Letters, June 2012, American Institute of Physics
  • DOI: 10.1063/1.4727893

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http://dx.doi.org/10.1063/1.4727893

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