Electronic structure of La5/3Sr1/3NiO4 by x-ray emission spectroscopy and resonant inelastic x-ray scattering

L. Simonelli, N. L. Saini, S. Huotari, V. M. Giordano, G. Monaco
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4726248