Identifying passivated dynamic force microscopy tips on H:Si(100)

  • Peter Sharp, Sam Jarvis, Richard Woolley, Adam Sweetman, Lev Kantorovich, Chris Pakes, Philip Moriarty
  • Applied Physics Letters, June 2012, American Institute of Physics
  • DOI: 10.1063/1.4726086

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http://dx.doi.org/10.1063/1.4726086

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