Origin of self-heating effect induced asymmetrical degradation behavior in InGaZnO thin-film transistors

Tien-Yu Hsieh, Ting-Chang Chang, Te-Chih Chen, Ming-Yen Tsai, Yu-Te Chen, Yi-Chen Chung, Hung-Che Ting, Chia-Yu Chen
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4723573