Metamaterial near-field sensor for deep-subwavelength thickness measurements and sensitive refractometry in the terahertz frequency range

Benjamin Reinhard, Klemens M. Schmitt, Viktoria Wollrab, Jens Neu, René Beigang, Marco Rahm
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4722801