The asymmetrical degradation behavior on drain bias stress under illumination for InGaZnO thin film transistors

Sheng-Yao Huang, Ting-Chang Chang, Li-Wei Lin, Man-Chun Yang, Min-Chen Chen, Jhe-Ciou Jhu, Fu-Yen Jian
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4722787