The asymmetrical degradation behavior on drain bias stress under illumination for InGaZnO thin film transistors

  • Sheng-Yao Huang, Ting-Chang Chang, Li-Wei Lin, Man-Chun Yang, Min-Chen Chen, Jhe-Ciou Jhu, Fu-Yen Jian
  • Applied Physics Letters, May 2012, American Institute of Physics
  • DOI: 10.1063/1.4722787

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http://dx.doi.org/10.1063/1.4722787

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