Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe/SiO2 superlattice

E. M. F. Vieira, J. Martín-Sánchez, A. G. Rolo, A. Parisini, M. Buljan, I. Capan, E. Alves, N. P. Barradas, O. Conde, S. Bernstorff, A. Chahboun, S. Levichev, M. J. M. Gomes
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4722278
The author haven't yet claimed this publicationThe author haven't yet claimed this publication