Kubo-Greenwood approach for the calculation of mobility in gate-all-around nanowire metal-oxide-semiconductor field-effect transistors including screened remote Coulomb scattering—Comparison with experiment

J. Dura, F. Triozon, S. Barraud, D. Munteanu, S. Martinie, J. L. Autran
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4719081
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