Relationship between threading dislocation and leakage current in 4H-SiC diodes

  • Hirokazu Fujiwara, Hideki Naruoka, Masaki Konishi, Kimimori Hamada, Takashi Katsuno, Tsuyoshi Ishikawa, Yukihiko Watanabe, Takeshi Endo
  • Applied Physics Letters, June 2012, American Institute of Physics
  • DOI: 10.1063/1.4718527

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http://dx.doi.org/10.1063/1.4718527

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