Contact resistance as a probe of near-interface ferromagnetism in GaMnAs/Cu bilayers

  • K. F. Eid, B. Paudel, G. Riley, D. Dahliah, X. Liu, J. K. Furdyna
  • Applied Physics Letters, May 2012, American Institute of Physics
  • DOI: 10.1063/1.4716471

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http://dx.doi.org/10.1063/1.4716471

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