Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope

A. Imtiaz, T. M. Wallis, S.-H. Lim, H. Tanbakuchi, H.-P. Huber, A. Hornung, P. Hinterdorfer, J. Smoliner, F. Kienberger, P. Kabos
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4716026