Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters

  • C. Dwyer, C. Maunders, C. L. Zheng, M. Weyland, P. C. Tiemeijer, J. Etheridge
  • Applied Physics Letters, May 2012, American Institute of Physics
  • DOI: 10.1063/1.4711766

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http://dx.doi.org/10.1063/1.4711766

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