Interface trap generation and recovery mechanisms during and after positive bias stress in metal-oxide-semiconductor structures

  • Piyas Samanta, Heng-Sheng Huang, Shuang-Yuan Chen, Tsung-Jian Tzeng, Mu-Chun Wang
  • Applied Physics Letters, May 2012, American Institute of Physics
  • DOI: 10.1063/1.4711216

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

The following have contributed to this page: Dr PIYAS SAMANTA