Te-based chalcogenide films with high thermal stability for phase change memory

Guoxiang Wang, Xiang Shen, Qiuhua Nie, Fen Chen, Xunsi Wang, Jing Fu, Yu Chen, Tiefeng Xu, Shixun Dai, Wei Zhang, Rongping Wang
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4711069
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