Evolution of electrical performance of ZnO-based thin-film transistors by low temperature annealing

J. Zhang, X. F. Li, J. G. Lu, P. Wu, J. Huang, Q. Wang, B. Lu, Y. Z. Zhang, B. H. Zhao, Z. Z. Ye
  • AIP Advances, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4711046
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