Interface and oxide quality of CoFeB/MgO/Si tunnel junctions

Jonathan T. Shaw, H. W. Tseng, Shantanu Rajwade, Lieh-Ting Tung, R. A. Buhrman, Edwin C. Kan
  • Journal of Applied Physics, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4709766