Defect level distributions and atomic relaxations induced by charge trapping in amorphous silica

  • Nathan L. Anderson, Ravi Pramod Vedula, Peter A. Schultz, R. M. Van Ginhoven, Alejandro Strachan
  • Applied Physics Letters, April 2012, American Institute of Physics
  • DOI: 10.1063/1.4707340

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http://dx.doi.org/10.1063/1.4707340

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