Electrical and reliability characteristics of polycrystalline silicon thin-film transistors with high-κ Eu2O3 gate dielectrics

Li-Chen Yen, Chia-Wei Hu, Tsung-Yu Chiang, Tien-Sheng Chao, Tung-Ming Pan
  • Applied Physics Letters, January 2012, American Institute of Physics
  • DOI: 10.1063/1.4705472