Electrical and reliability characteristics of polycrystalline silicon thin-film transistors with high-κ Eu2O3gate dielectrics

  • Li-Chen Yen, Chia-Wei Hu, Tsung-Yu Chiang, Tien-Sheng Chao, Tung-Ming Pan
  • Applied Physics Letters, April 2012, American Institute of Physics
  • DOI: 10.1063/1.4705472

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http://dx.doi.org/10.1063/1.4705472

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